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Technology life cycle analysis method based on patent documents
Lidan Gao(高利丹); Alan L. Porter; Jing Wang; Shu Fang(方曙); Xian Zhang(张娴); Tingting Ma; Wenping Wang; Lu Huang
2013
Source PublicationTechnological Forecasting & Social Change 80 (2013) 398–407
Issue80Pages:398-407
KeywordTechnology Life Cycle Patent Indicator Cathode Ray Tube Thin Film Transistor Liquid Crystal Display Nano-biosensor
Subject Area情报研究 ; 情报研究理论与方法
WOS IDWOS:000316510300003
Citation statistics
Cited Times:52[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.las.ac.cn/handle/12502/6268
Collection中国科学院成都文献情报中心_情报研究部
Recommended Citation
GB/T 7714
Lidan Gao,Alan L. Porter,Jing Wang,et al. Technology life cycle analysis method based on patent documents[J]. Technological Forecasting & Social Change 80 (2013) 398–407,2013(80):398-407.
APA Lidan Gao.,Alan L. Porter.,Jing Wang.,Shu Fang.,Xian Zhang.,...&Lu Huang.(2013).Technology life cycle analysis method based on patent documents.Technological Forecasting & Social Change 80 (2013) 398–407(80),398-407.
MLA Lidan Gao,et al."Technology life cycle analysis method based on patent documents".Technological Forecasting & Social Change 80 (2013) 398–407 .80(2013):398-407.
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