Technology life cycle analysis method based on patent documents

	Technology life cycle analysis method based on patent documents
	Lidan Gao(高利丹); Alan L. Porter; Jing Wang; Shu Fang(方曙); Xian Zhang(张娴); Tingting Ma; Wenping Wang; Lu Huang
	2013
发表期刊	Technological Forecasting & Social Change 80 (2013) 398–407
期号	80 页码:398-407
关键词	Technology Life Cycle Patent Indicator Cathode Ray Tube Thin Film Transistor Liquid Crystal Display Nano-biosensor
学科领域	情报研究 ; 情报研究理论与方法
WOS记录号	WOS:000316510300003
引用统计
文献类型	期刊论文
条目标识符	http://ir.las.ac.cn/handle/12502/6268
专题	中国科学院成都文献情报中心_情报研究部
推荐引用方式 GB/T 7714	Lidan Gao,Alan L. Porter,Jing Wang,et al. Technology life cycle analysis method based on patent documents[J]. Technological Forecasting & Social Change 80 (2013) 398–407,2013(80):398-407.
APA	Lidan Gao.,Alan L. Porter.,Jing Wang.,Shu Fang.,Xian Zhang.,...&Lu Huang.(2013).Technology life cycle analysis method based on patent documents.Technological Forecasting & Social Change 80 (2013) 398–407(80),398-407.
MLA	Lidan Gao,et al."Technology life cycle analysis method based on patent documents".Technological Forecasting & Social Change 80 (2013) 398–407 .80(2013):398-407.