Technology life cycle analysis method based on patent documents | |
Lidan Gao(高利丹); Alan L. Porter; Jing Wang; Shu Fang(方曙); Xian Zhang(张娴)![]() | |
2013 | |
Source Publication | Technological Forecasting & Social Change 80 (2013) 398–407
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Issue | 80Pages:398-407 |
Keyword | Technology Life Cycle Patent Indicator Cathode Ray Tube Thin Film Transistor Liquid Crystal Display Nano-biosensor |
Subject Area | 情报研究 ; 情报研究理论与方法 |
WOS ID | WOS:000316510300003 |
Citation statistics | |
Document Type | 期刊论文 |
Identifier | http://ir.las.ac.cn/handle/12502/6268 |
Collection | 中国科学院成都文献情报中心_情报研究部 |
Recommended Citation GB/T 7714 | Lidan Gao,Alan L. Porter,Jing Wang,et al. Technology life cycle analysis method based on patent documents[J]. Technological Forecasting & Social Change 80 (2013) 398–407,2013(80):398-407. |
APA | Lidan Gao.,Alan L. Porter.,Jing Wang.,Shu Fang.,Xian Zhang.,...&Lu Huang.(2013).Technology life cycle analysis method based on patent documents.Technological Forecasting & Social Change 80 (2013) 398–407(80),398-407. |
MLA | Lidan Gao,et al."Technology life cycle analysis method based on patent documents".Technological Forecasting & Social Change 80 (2013) 398–407 .80(2013):398-407. |
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