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Title: Technology life cycle analysis method based on patent documents
Author: Lidan Gao(高利丹) ; Alan L. Porter ; Jing Wang ; Shu Fang(方曙) ; Xian Zhang(张娴) ; Tingting Ma ; Wenping Wang ; Lu Huang
Source: Technological Forecasting & Social Change 80 (2013) 398–407
Issued Date: 2013
Issue: 80, Pages:398-407
Keyword: Technology life cycle ; Patent ; Indicator ; Cathode ray tube ; Thin film transistor liquid crystal display ; Nano-biosensor
Subject: 情报研究 ; 情报研究::情报研究理论与方法
WOS ID: WOS:000316510300003
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Content Type: 期刊论文
URI: http://ir.las.ac.cn/handle/12502/6268
Appears in Collections:中国科学院成都文献情报中心_情报研究部_期刊论文

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Recommended Citation:
Lidan Gao,Alan L. Porter,Jing Wang,et al. Technology life cycle analysis method based on patent documents[J]. Technological Forecasting & Social Change 80 (2013) 398–407,2013(80):398-407.
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