NSL OpenIR  > 中国科学院成都文献情报中心  > 情报研究部
TECHNOLOGY LIFE CYCLE ANALYSIS MODELLING BASED ON PATENT DOCUMENTS
Lidan Gao(高利丹); Alan L Porter; Jing Wang; Shu Fang(方曙); Xian Zhang(张娴); Tingting Ma; Wenping Wang; Lu Huang
2011-07-20
Conference NameThe 4th International Seville Conference on Future-Oriented Technology Analysis(FTA)
Source PublicationFTA and Grand Societal Challenges: Shaping and Driving Structural and Systemic Transformations
Conference Date2011-05-12~2011-05-13
Conference PlaceSpain, Seville
Funding OrganizationEuropean CommissionJoint Research CentreInstitute for Prospective Technological Studies
AbstractTo estimate the future development of one technology and make decisions whether to invest in it or not, one needs to know the stage status of its technology life cycle (TLC). The major approach to analysing TLC uses the S-curve to observe patent applications over time. But using the patent application counts alone to represent the development of technology oversimplifies the situation. In this paper, we build a model to calculate the TLC for an object technology based on multiple patent-related indicators. The model includes the following steps: first, we focus on devising and assessing patent-based TLC indicators. Then we choose some technologies (training technologies) with identified life cycle stages, and finally compare the indicator features in training technologies with the indicator values in an object technology (test technology) by Nearest Neighbour Classifier, which is widely used in Pattern Recognition, to measure the technology life cycle stages of the object technology. The method and result of this study can be used in management practice to enable technology observers to determine the current life cycle stage of a particular technology of interest.
KeywordTechnology Life Cycle Patent Indicator Cathode Ray Tube Thin Film Transistor Liquid Crystal Display Nano-biosensor
Subject Area情报研究理论与方法
Language中文
Document Type会议论文
Identifierhttp://ir.las.ac.cn/handle/12502/3823
Collection中国科学院成都文献情报中心_情报研究部
Recommended Citation
GB/T 7714
Lidan Gao,Alan L Porter,Jing Wang,et al. TECHNOLOGY LIFE CYCLE ANALYSIS MODELLING BASED ON PATENT DOCUMENTS[C],2011.
Files in This Item: Download All
File Name/Size DocType Version Access License
Lidan Gao_full__ pap(710KB) 开放获取CC BY-NC-SAView Download
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[Lidan Gao(高利丹)]'s Articles
[Alan L Porter]'s Articles
[Jing Wang]'s Articles
Baidu academic
Similar articles in Baidu academic
[Lidan Gao(高利丹)]'s Articles
[Alan L Porter]'s Articles
[Jing Wang]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[Lidan Gao(高利丹)]'s Articles
[Alan L Porter]'s Articles
[Jing Wang]'s Articles
Terms of Use
No data!
Social Bookmark/Share
File name: Lidan Gao_full__ paper_20110404.doc
Format: Microsoft Word
This file does not support browsing at this time
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.