| Average Cycle of Patent Examination in PR China is the Shortest throughout the World | |
Tian YJ(田雅娟)
| |
| 2008 | |
| Source Publication | World Patent Information
 |
| Volume | 30Issue:1Pages:77-78 |
| Subject Area | 科学文化传播 |
| Indexed By | 其他 |
| Language | 中文 |
| Document Type | 期刊论文 |
| Identifier | http://ir.las.ac.cn/handle/12502/2505 |
| Collection | 中国科学院成都文献情报中心_区域发展咨询部_信息服务部 |
| Recommended Citation GB/T 7714 | Tian YJ. Average Cycle of Patent Examination in PR China is the Shortest throughout the World[J]. World Patent Information,2008,30(1):77-78. |
| APA | 田雅娟.(2008).Average Cycle of Patent Examination in PR China is the Shortest throughout the World.World Patent Information,30(1),77-78. |
| MLA | 田雅娟."Average Cycle of Patent Examination in PR China is the Shortest throughout the World".World Patent Information 30.1(2008):77-78. |
| Files in This Item: | Download All | |||||
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| Average Cycle of Pat（74KB） | 开放获取 | License | View Download | |||
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