Average Cycle of Patent Examination in PR China is the Shortest throughout the World

	Average Cycle of Patent Examination in PR China is the Shortest throughout the World
	Tian YJ(田雅娟)
	2008
发表期刊	World Patent Information
卷号	30 期号:1 页码:77-78
学科领域	科学文化传播
收录类别	其他
语种	中文
文献类型	期刊论文
条目标识符	http://ir.las.ac.cn/handle/12502/2505
专题	中国科学院成都文献情报中心_信息服务部
推荐引用方式 GB/T 7714	Tian YJ. Average Cycle of Patent Examination in PR China is the Shortest throughout the World[J]. World Patent Information,2008,30(1):77-78.
APA	田雅娟.(2008).Average Cycle of Patent Examination in PR China is the Shortest throughout the World.World Patent Information,30(1),77-78.
MLA	田雅娟."Average Cycle of Patent Examination in PR China is the Shortest throughout the World".World Patent Information 30.1(2008):77-78.