Average Cycle of Patent Examination in PR China is the Shortest throughout the World

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Title:	Average Cycle of Patent Examination in PR China is the Shortest throughout the World
Author:	Tian YJ(田雅娟)
Source:	World Patent Information
Issued Date:	2008
Volume:	30, Issue:1, Pages:77-78
Subject:	科学文化传播
Indexed Type:	其他
Language:	中文
Content Type:	期刊论文
URI:	http://ir.las.ac.cn/handle/12502/2505
Appears in Collections:	中国科学院成都文献情报中心_信息服务部_期刊论文

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Average Cycle of Patent Examination in PR China is the2008-1.pdf（74KB）	--	--	开放获取	License	View Download

Recommended Citation:

Tian YJ. Average Cycle of Patent Examination in PR China is the Shortest throughout the World[J]. World Patent Information,2008,30(1):77-78.

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