Average Cycle of Patent Examination in PR China is the Shortest throughout the World | |
Tian YJ(田雅娟)![]() | |
2008 | |
Source Publication | World Patent Information
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Volume | 30Issue:1Pages:77-78 |
Subject Area | 科学文化传播 |
Indexed By | 其他 |
Language | 中文 |
Document Type | 期刊论文 |
Identifier | http://ir.las.ac.cn/handle/12502/2505 |
Collection | 中国科学院成都文献情报中心_区域发展咨询部_信息服务部 |
Recommended Citation GB/T 7714 | Tian YJ. Average Cycle of Patent Examination in PR China is the Shortest throughout the World[J]. World Patent Information,2008,30(1):77-78. |
APA | 田雅娟.(2008).Average Cycle of Patent Examination in PR China is the Shortest throughout the World.World Patent Information,30(1),77-78. |
MLA | 田雅娟."Average Cycle of Patent Examination in PR China is the Shortest throughout the World".World Patent Information 30.1(2008):77-78. |
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